HTRB Stress Effects on Static and Dynamic Characteristics of 0.15 μm AlGaN/GaN HEMTs

Authors
Raja P.V.; Nallatamby J.-C.; Bouslama M.; Jacquet J.-C.; Sommet R.; Chang C.; Lambert B.
Source title
IEEE Transactions on Microwave Theory and Techniques
DOI
10.1109/TMTT.2022.3222190
Publication Year